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Please use this identifier to cite or link to this item: http://dspace.utalca.cl/handle/1950/8800

Title: Bayesian estimation of regression parameters in elliptical measurement error models
Authors: Vidal, I.
Bolfarini, H.
Keywords: Bayesian inference
Dependent measurement error model
Elliptical distribution
Issue Date: Sep-2011
Publisher: ELSEVIER SCIENCE BV, PO BOX 211
Citation: STATISTICS & PROBABILITY LETTERS Volume: 81 Issue: 9 Pages: 1398-1406 DOI: 10.1016/j.spl.2011.04.014
Abstract: he main object of this paper is to discuss the Bayes estimation of the regression coefficients in the elliptically distributed simple regression model with measurement errors. The posterior distribution for the line parameters is obtained in a closed form, considering the following: the ratio of the error variances is known, informative prior distribution for the error variance, and non-informative prior distributions for the regression coefficients and for the incidental parameters. We proved that the posterior distribution of the regression coefficients has at most two real modes. Situations with a single mode are more likely than those with two modes, especially in large samples. The precision of the modal estimators is studied by deriving the Hessian matrix, which although complicated can be computed numerically. The posterior mean is estimated by using the Gibbs sampling algorithm and approximations by normal distributions. The results are applied to a real data set and connections with results in the literature are reported. (C) 2011 Elsevier B.V. All rights reserved.
Description: Vidal, I (reprint author), Univ Talca, Inst Matemat & Fis, 2 Norte 685, Talca, Chile.
URI: http://dspace.utalca.cl/handle/1950/8800
ISSN: 0167-7152
Appears in Collections:Artículos en publicaciones ISI - Universidad de Talca

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